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View all instruments of this unit Characterization of Insulator Integrity and Reliability Keithley K236, K237 und K238
Basic Information
| Name: | Characterization of Insulator Integrity and Reliability | |
| Manufacturer: | Keithley | |
| Model: | K236, K237 und K238 | |
| Facility: | 200 mm MEMS-Cleanroom | |
| Partner: | Fraunhofer Institute for Photonic Microsystems (IPMS) |
|
| Inventory number: | WLR-PROB02 | |
Description
- Breakdown field; Weibull plot; Time / charge to breakdown (Eramp and Econst (TDDB))
- Time / charge to breakdown; breakdown voltage; Weibull plot (Jramp; Jconst)
Options of instrument usage
- This instrument is used within a service or research collaboration.
Points of Contact
Associated Services
| Name | Preview | Actions |
|---|---|---|
| Test of wafer |
Last Update
Last updated at: 14 January 2025 at 15:51:51