Laboratory for preparation using electron microscopy

Facility: Competence Materials Characterization and Testing

Analytic double-beam-system Focused Ion Beam and scanning electron microscope

Manufacturer: JEOL
Model: JIB-4610F
Facility: Competence Materials Characterization and Testing

Analytic double-beam-system Focused Ion Beam and scanning electron microscope - JEOL JIB-4610F

Analytic transmission electron microscope 200 kV

Manufacturer: JEOL
Model: JEM-2100Plus
Facility: Competence Materials Characterization and Testing

Analytic transmission electron microscope 200 kV- JEOL JEM-2100Plus

Field Emission Scanning Electron Microscope (FE-SEM)

Manufacturer: JEOL GmbH
Model: JSM-7800F Prime (SEM) FE REM
Facility: Competence Materials Characterization and Testing

Analytical field emission scanning electron microscope with ultra-high resolution

Scanning Electron Microscope (SEM)

Manufacturer: JEOL GmbH
Model: JSM-6610LV
Facility: Competence Materials Characterization and Testing

Analytical scanning electron microscope with "Low-Vacuum"