128 results
X-ray Microscope (XRM)
Manufacturer: Xradia (now Carl Zeiss Ultra) Model: NanoXCT-100 Facility: Microelectronic Materials and Nanoanalysis
Field Emission Scanning Electron Microscope (FE SEM) with focused ion beam (REM/ FIB)
Manufacturer: Carl Zeiss SMT AG Model: CrossBeam NVision 40 ® Facility: Microelectronic Materials and Nanoanalysis
Helios 5 PFIB CXe DualBeam
Manufacturer: ThermoFisher Model: Helios 5 PFIB CXe Facility: Microelectronic Materials and Nanoanalysis
BET Accelerated Surface Area and Porosimetry (ASAP) Analyzer
Manufacturer: Micromeritics GmbH Model: ASAP 2010 BET Facility: Powder and suspension characterization
Electromechanical Tensile-Compression Testing Machine
Manufacturer: ZwickRoell GmbH Model: Z250 Facility: Chair of Inorganic Non-Metallic Materials
HG-Porosimeter / Quecksilber Porosimeter
Manufacturer: Micromeritics GmbH Model: AutoPore IV 9500 Facility: Powder and suspension characterization
Accelerated Surface Area and Porosimetry (ASAP) Analyzer
Manufacturer: Micromeritics GmbH Model: ASAP 2020 MP Facility: Powder and suspension characterization
Tube Furnace with Sourcemeter und Nanovoltmeter
Manufacturer: Tektronix GmbH / Keithley Model: 2611A / 2182A Facility: Mechanical Testing of Materials
Tube Furnace with Multimeter for Resistance 2- or 4-wire
Manufacturer: Tektronix GmbH / Keithley Model: 2750 Facility: Mechanical Testing of Materials