128 results
X-ray Microscope (XRM)
Manufacturer: Xradia (now Carl Zeiss Ultra)
Model: NanoXCT-100
Facility: Microelectronic Materials and Nanoanalysis
Field Emission Scanning Electron Microscope (FE SEM) with focused ion beam (REM/ FIB)
Manufacturer: Carl Zeiss SMT AG
Model: CrossBeam NVision 40 ®
Facility: Microelectronic Materials and Nanoanalysis
Helios 5 PFIB CXe DualBeam
Manufacturer: ThermoFisher
Model: Helios 5 PFIB CXe
Facility: Microelectronic Materials and Nanoanalysis
BET Accelerated Surface Area and Porosimetry (ASAP) Analyzer
Manufacturer: Micromeritics GmbH
Model: ASAP 2010 BET
Facility: Powder and suspension characterization
Electromechanical Tensile-Compression Testing Machine
Manufacturer: ZwickRoell GmbH
Model: Z250
Facility: Chair of Inorganic Non-Metallic Materials
HG-Porosimeter / Quecksilber Porosimeter
Manufacturer: Micromeritics GmbH
Model: AutoPore IV 9500
Facility: Powder and suspension characterization
Accelerated Surface Area and Porosimetry (ASAP) Analyzer
Manufacturer: Micromeritics GmbH
Model: ASAP 2020 MP
Facility: Powder and suspension characterization
Tube Furnace with Sourcemeter und Nanovoltmeter
Manufacturer: Tektronix GmbH / Keithley
Model: 2611A / 2182A
Facility: Mechanical Testing of Materials
Tube Furnace with Multimeter for Resistance 2- or 4-wire
Manufacturer: Tektronix GmbH / Keithley
Model: 2750
Facility: Mechanical Testing of Materials