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X-Ray Scattering (XRD/XRR)
Manufacturer: Bruker Corporation
Model: D8 DISCOVER
Facility: Analytics and Metrology
Electron Microscopy
Manufacturer: Hitachi; Thermo Fischer; FEI Tecnai
Model: S-5000; Apreo S; F20
Facility: Analytics and Metrology
Time-Of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
Manufacturer: ION-TOF GmbH
Model: TOF.SIMS 300R
Facility: Analytics and Metrology
X-Ray Photoelectron Spectroscope (XPS)
Manufacturer: PHI Quantes Scanning XPS/HAXPES Microprobe
Facility: Analytics and Metrology