11 results
Field Emission Scanning Electron Microscope (FE SEM / FE REM Rasterelektronenmikroskop)
Manufacturer: Hitachi High Technologies
Model: S-5000
Facility: Analytics
Fourier Transform Infra Red Spectrometer (FT-IR)
Manufacturer: Varian Inc. (now: Agilent Technologies)
Model: 640-IR
Facility: High-k Devices
DualBeam Field Emission Scanning Electron Microscope with Focused Ion Beam (FE SEM/ FIB)
Manufacturer: FEI Company
Model: Strata 400 STEM
Facility: Analytics
Atom Probe Tomography Microscope (ATP)
Manufacturer: Imago Scientific Instruments (now: Ametek/ CAMECA)
Model: LEAP 3000X S
Facility: Analytics
Transmission Electron Microscope (TEM)
Manufacturer: FEI Company
Model: Tecnai F20 XT/STEM
Facility: Analytics
X-Ray Diffraction System (XRD/XRR)
Manufacturer: Bruker Corporation
Model: D8 DISCOVER
Facility: Analytics
X-Ray Photoelectron Spectroscope (XPS)
Manufacturer: Thermo Fisher Scientific Inc.
Model: Theta 300i
Facility: Analytics