View all instruments of this unit Field Emission Scanning Electron Microscope (FE SEM / FE REM Rasterelektronenmikroskop) Hitachi High Technologies S-5000
Basic Information
| Name: | Field Emission Scanning Electron Microscope (FE SEM / FE REM Rasterelektronenmikroskop) | |
| Manufacturer: | Hitachi High Technologies | |
| Model: | S-5000 | |
| Facility: | Analytics of the Center Nanoelectronic Technologies (CNT) | |
| Partner: | Fraunhofer Institute for Photonic Microsystems (IPMS) |
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Description
Measure/Resolution:
~ 2 nm
Accessory/Options:
~ 2 nm
Link to Further Details
Points of Contact
Dr. Wenke Weinreich
Web:
Phone:
+49 351 26 07-3053
Fax:
+49 351 2607-3005
Notes
This is an instrument within the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA).
Images
| Preview | Description |
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FE SEM Hitachi S5000 (Quelle: www.fabsurplus.com) |
Last Update
Last updated at: 13 July 2017 at 11:54:12