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View the profile: Analytics and Metrology

Equipment of Analytics and Metrology

Fraunhofer Institute for Photonic Microsystems
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Inline Metrology

Facility: Analytics and Metrology

 

Raman Spectroscopy

Manufacturer: Renishaw
Model: Invia Reflex
Facility: Analytics and Metrology

 
Bruker TXRF-Spectrometer S2 Picofox (Quelle: www.bruker.com)

Light Microscopy

Manufacturer: Zeiss
Model: Zeiss Axio Imager KMAT und Axio Imager.A1m
Facility: Analytics and Metrology

 
FEI Strata 400 STEM (Quelle: www.ims.uconn.edu)

Focused Ion Beam

Manufacturer: FEI Company
Model: Strata 400
Facility: Analytics and Metrology

 
CAMECA LEAP 4000 Si (Quelle: www.cameca.com)

Atomic Force Microscopy (AFM)

Manufacturer: Oxford Instruments
Model: Asylum Research Cypher
Facility: Analytics and Metrology

 
Bruker XRD D8 DISCOVER (Quelle: www.bruker.com)

X-Ray Scattering (XRD/XRR)

Manufacturer: Bruker Corporation
Model: D8 DISCOVER
Facility: Analytics and Metrology

 
FE SEM Hitachi S5000 (Quelle: www.fabsurplus.com)

Electron Microscopy

Manufacturer: Hitachi; Thermo Fischer; FEI Tecnai
Model: S-5000; Apreo S; F20
Facility: Analytics and Metrology

 
ION-TOF TOF.SIMS 300 R (Quelle: www.iontof.com)

Time-Of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

Manufacturer: ION-TOF GmbH
Model: TOF.SIMS 300R
Facility: Analytics and Metrology

 
XPS Thermo Fisher Scientific Theta 300 (Quelle: www.thermoscientific.com)

X-Ray Photoelectron Spectroscope (XPS)

Manufacturer: PHI Quantes Scanning XPS/HAXPES Microprobe
Facility: Analytics and Metrology

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