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View the profile: Analytics

Equipment of Analytics

Fraunhofer Institute for Photonic Microsystems
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FE SEM Hitachi S5000 (Quelle: www.fabsurplus.com)

Field Emission Scanning Electron Microscope (FE SEM / FE REM Rasterelektronenmikroskop)

Manufacturer: Hitachi High Technologies
Model: S-5000
Facility: Analytics

 
ION-TOF TOF.SIMS 300 R (Quelle: www.iontof.com)

TOF-SIMS

Manufacturer: ION-TOF GmbH
Model: TOF.SIMS 300R
Facility: Analytics

 
FEI Strata 400 STEM (Quelle: www.ims.uconn.edu)

DualBeam Field Emission Scanning Electron Microscope with Focused Ion Beam (FE SEM/ FIB)

Manufacturer: FEI Company
Model: Strata 400 STEM
Facility: Analytics

 
CAMECA LEAP 4000 Si (Quelle: www.cameca.com)

Atom Probe Tomography Microscope (ATP)

Manufacturer: Imago Scientific Instruments (now: Ametek/ CAMECA)
Model: LEAP 3000X S
Facility: Analytics

 
FEI Tecnai F20 XT/STEM (Quelle: www.fei.com)

Transmission Electron Microscope (TEM)

Manufacturer: FEI Company
Model: Tecnai F20 XT/STEM
Facility: Analytics

 
Bruker XRD D8 DISCOVER (Quelle: www.bruker.com)

X-Ray Diffraction System (XRD/XRR)

Manufacturer: Bruker Corporation
Model: D8 DISCOVER
Facility: Analytics

 
XPS Thermo Fisher Scientific Theta 300 (Quelle: www.thermoscientific.com)

X-Ray Photoelectron Spectroscope (XPS)

Manufacturer: Thermo Fisher Scientific Inc.
Model: Theta 300i
Facility: Analytics

 
Bruker TXRF-Spectrometer S2 Picofox (Quelle: www.bruker.com)

Total Reflection X-Ray Fluorescence Spectrometer (TXRF)

Manufacturer: Bruker Corporation
Model: S2 Picofox
Facility: Analytics

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