DualBeam Field Emission Scanning Electron Microscope with Focused Ion Beam (FE SEM/ FIB) FEI Company Strata 400 STEM
Basic Information
Name: | DualBeam Field Emission Scanning Electron Microscope with Focused Ion Beam (FE SEM/ FIB) | |
Manufacturer: | FEI Company | |
Model: | Strata 400 STEM | |
Facility: | Analytics of the Center Nanoelectronic Technologies (CNT) | |
Partner: | Fraunhofer Institute for Photonic Microsystems (IPMS) |
Description
Measure/Resolution:
~ 2 nm
Accessory/Options:
Omniprobe, STEM
Link to Further Details
Points of Contact
Dr. Wenke Weinreich
Web:
Phone:
+49 351 26 07-3053
Fax:
+49 351 2607-3005
Notes
This is an instrument within the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA).
Images
Last Update
Last updated at: 13 July 2017 at 11:54:12