Dresden
Technology Portal

 
Your access to research infrastructure and know-how
de|en
View all instruments of this unit

DualBeam Field Emission Scanning Electron Microscope with Focused Ion Beam (FE SEM/ FIB) FEI Company Strata 400 STEM

Basic Information

Name: DualBeam Field Emission Scanning Electron Microscope with Focused Ion Beam (FE SEM/ FIB)
Manufacturer: FEI Company
Model: Strata 400 STEM
Facility: Analytics of the Center Nanoelectronic Technologies (CNT)
Partner: Fraunhofer Institute for Photonic Microsystems (IPMS)

Description

Measure/Resolution:

~ 2 nm

Accessory/Options:

Omniprobe, STEM

Link to Further Details

http://www.fei.com/

Points of Contact

Dr. Wenke Weinreich
Phone:
+49 351 26 07-3053
Fax:
+49 351 2607-3005

Notes

This is an instrument within the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA).

Images

Last Update

Last updated at: 13 July 2017 at 11:54:12