45 results
Defect Measurement
Manufacturer: Applied Materials; Leica; Semilab
Model: Compass Pro; INS3000; FAaST 230
Facility: 200 mm MEMS-Cleanroom
White-Light Interferometer (Optical Profiler)
Manufacturer: Veeco Instruments
Model: NT8000
Facility: 200 mm MEMS-Cleanroom
Atomic Force Microscope (AFM)
Manufacturer: Veeco; Park Systems
Model: Nanoscope D3100; NX-Wafer
Facility: 200 mm MEMS-Cleanroom
Critical Dimension Scanning Electron Microscope (CD-SEM)
Manufacturer: Applied Materials
Model: Verity Lite
Facility: 200 mm MEMS-Cleanroom
Field Emission Scanning Electron Microscope (FE SEM )
Manufacturer: JEOL GmbH; FEI
Model: JSM-6700F; Helios Nanolab 660
Facility: 200 mm MEMS-Cleanroom
Film Thickness Measurement
Manufacturer: Screen; Olympian
Model: Lambda Ace RE-3300; n & k
Facility: 200 mm MEMS-Cleanroom