45 results
Defect Measurement
Manufacturer: Applied Materials; Leica; Semilab Model: Compass Pro; INS3000; FAaST 230 Facility: 200 mm MEMS-Cleanroom
White-Light Interferometer (Optical Profiler)
Manufacturer: Veeco Instruments Model: NT8000 Facility: 200 mm MEMS-Cleanroom
Atomic Force Microscope (AFM)
Manufacturer: Veeco; Park Systems Model: Nanoscope D3100; NX-Wafer Facility: 200 mm MEMS-Cleanroom
Critical Dimension Scanning Electron Microscope (CD-SEM)
Manufacturer: Applied Materials Model: Verity Lite Facility: 200 mm MEMS-Cleanroom
Field Emission Scanning Electron Microscope (FE SEM )
Manufacturer: JEOL GmbH; FEI Model: JSM-6700F; Helios Nanolab 660 Facility: 200 mm MEMS-Cleanroom
Film Thickness Measurement
Manufacturer: Screen; Olympian Model: Lambda Ace RE-3300; n & k Facility: 200 mm MEMS-Cleanroom


