88 results
Biaxial Tension – Torsion Test Bench
Manufacturer: INOVA Model: Torsions-Axial-Prüfsystem Facility: Competence Materials Characterization and Testing
INOVA Torsion - Axial Test Bench
Analytic double-beam-system Focused Ion Beam and scanning electron microscope
Manufacturer: JEOL Model: JIB-4610F Facility: Competence Materials Characterization and Testing
Analytic double-beam-system Focused Ion Beam and scanning electron microscope - JEOL JIB-4610F
Analytic transmission electron microscope 200 kV
Manufacturer: JEOL Model: JEM-2100Plus Facility: Competence Materials Characterization and Testing
Analytic transmission electron microscope 200 kV- JEOL JEM-2100Plus
Field Emission Scanning Electron Microscope (FE-SEM)
Manufacturer: JEOL GmbH Model: JSM-7800F Prime (SEM) FE REM Facility: Competence Materials Characterization and Testing
Analytical field emission scanning electron microscope with ultra-high resolution
Scanning Electron Microscope (SEM)
Manufacturer: JEOL GmbH Model: JSM-6610LV Facility: Competence Materials Characterization and Testing
Analytical scanning electron microscope with "Low-Vacuum"
Nanoparticle Tracking Analysis (NTA) / Nanopartikelmesstechnik
Manufacturer: NanoSight Ltd (now: Malvern Instruments Ltd) Model: LM10-HS Facility: Surface Functionalization
VIS/IR -DLIP μFAB System
Manufacturer: Designed by TU Dresden, LMO Facility: Chair of Large Area Laser Based Surface Structuring
Tribometer / Rheometer
Manufacturer: Anton Paar Model: Tribometer T-PTD 200 / Rheometer MRC 502 Facility: Chair of Large Area Laser Based Surface Structuring