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View the profile: Fraunhofer Institute for Material and Beam Technology (IWS)

Equipment of Fraunhofer Institute for Material and Beam Technology (IWS)

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84 results

10point-bending test of braced skin sheets used in aircraft fuselage structures charged by shear and compression

Source: Fraunhofer IWS

hydraulic universal test benche ±100 kN

Manufacturer: Instron
Model: 8501
Facility: Competence Materials Characterization and Testing

hydraulic universal test benche ±100 kN - Instron 8501

Source: Fraunhofer IWS

Biaxial Tension – Torsion Test Bench

Manufacturer: INOVA
Model: Torsions-Axial-Prüfsystem
Facility: Competence Materials Characterization and Testing

INOVA Torsion - Axial Test Bench

Source: Fraunhofer IWS

Metallography laboratory

Facility: Competence Materials Characterization and Testing

preparation system Cross Section Polisher - JEOL IB09010CP

Source: Fraunhofer IWS

Laboratory for preparation using electron microscopy

Facility: Competence Materials Characterization and Testing

Source: Fraunhofer IWS

Analytic double-beam-system Focused Ion Beam and scanning electron microscope

Manufacturer: JEOL
Model: JIB-4610F
Facility: Competence Materials Characterization and Testing

Analytic double-beam-system Focused Ion Beam and scanning electron microscope - JEOL JIB-4610F

Source: Fraunhofer IWS

Analytic transmission electron microscope 200 kV

Manufacturer: JEOL
Model: JEM-2100Plus
Facility: Competence Materials Characterization and Testing

Analytic transmission electron microscope 200 kV- JEOL JEM-2100Plus

Analytical field emission scanning electron microscope with ultra-high resolution- JEOL JSM-7800F Prime

Source: Fraunhofer IWS

Field Emission Scanning Electron Microscope (FE-SEM)

Manufacturer: JEOL GmbH
Model: JSM-7800F Prime (SEM) FE REM
Facility: Competence Materials Characterization and Testing

Analytical field emission scanning electron microscope with ultra-high resolution

Analytical scanning electron microscope - JEOL JSM-6610 LV

Source: Fraunhofer IWS

Scanning Electron Microscope (SEM)

Manufacturer: JEOL GmbH
Model: JSM-6610LV
Facility: Competence Materials Characterization and Testing

Analytical scanning electron microscope with "Low-Vacuum"

Nanoparticle Tracking Analysis (NTA) / Nanopartikelmesstechnik

Manufacturer: NanoSight Ltd (now: Malvern Instruments Ltd)
Model: LM10-HS
Facility: Surface Functionalization

VIS/IR -DLIP μFAB System

Manufacturer: Designed by TU Dresden, LMO
Facility: Chair of Laser-based Manufacturing

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