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Equipment of Fraunhofer Institute for Material and Beam Technology (IWS)

Fraunhofer Institute for Material and Beam Technology (IWS)
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Analytic double-beam-system Focused Ion Beam and scanning electron microscope

Manufacturer: JEOL
Model: JIB-4610F
Facility: Competence Materials Characterization and Testing

Analytic double-beam-system Focused Ion Beam and scanning electron microscope - JEOL JIB-4610F

 

Analytic transmission electron microscope 200 kV

Manufacturer: JEOL
Model: JEM-2100Plus
Facility: Competence Materials Characterization and Testing

Analytic transmission electron microscope 200 kV- JEOL JEM-2100Plus

 

Field Emission Scanning Electron Microscope (FE-SEM)

Manufacturer: JEOL GmbH
Model: JSM-7800F Prime (SEM) FE REM
Facility: Competence Materials Characterization and Testing

Analytical field emission scanning electron microscope with ultra-high resolution

 

Scanning Electron Microscope (SEM)

Manufacturer: JEOL GmbH
Model: JSM-6610LV
Facility: Competence Materials Characterization and Testing

Analytical scanning electron microscope with "Low-Vacuum"

 

Nanoparticle Tracking Analysis (NTA) / Nanopartikelmesstechnik

Manufacturer: NanoSight Ltd (now: Malvern Instruments Ltd)
Model: LM10-HS
Facility: Surface Functionalization

 

Tribometer / Rheometer

Manufacturer: Anton Paar
Model: Tribometer T-PTD 200 / Rheometer MRC 502
Facility: Chair of Large Area Laser Based Surface Structuring

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