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Equipment of Fraunhofer Institute for Photonic Microsystems (IPMS)

Fraunhofer Institute for Photonic Microsystems (IPMS)
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17 results

 

Raman Spectroscopy

Manufacturer: Renishaw
Model: Invia Reflex
Facility: Analytics and Metrology

 

Light Microscopy

Manufacturer: Zeiss
Model: Zeiss Axio Imager KMAT und Axio Imager.A1m
Facility: Analytics and Metrology

 

Focused Ion Beam

Manufacturer: FEI Company
Model: Strata 400
Facility: Analytics and Metrology

 

Atomic Force Microscopy (AFM)

Manufacturer: Oxford Instruments
Model: Asylum Research Cypher
Facility: Analytics and Metrology

 

X-Ray Scattering (XRD/XRR)

Manufacturer: Bruker Corporation
Model: D8 DISCOVER
Facility: Analytics and Metrology

 

Electron Microscopy

Manufacturer: Hitachi; Thermo Fischer; FEI Tecnai
Model: S-5000; Apreo S; F20
Facility: Analytics and Metrology

 

Time-Of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

Manufacturer: ION-TOF GmbH
Model: TOF.SIMS 300R
Facility: Analytics and Metrology

 

X-Ray Photoelectron Spectroscope (XPS)

Manufacturer: PHI Quantes Scanning XPS/HAXPES Microprobe
Facility: Analytics and Metrology

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